A window layer is used in order to reduce the surface recombination velocity " S ".
2.
The shape of the contrast can be treated mathematically to determine the minority carrier properties of the semiconductor, such as diffusion length and surface recombination velocity.
3.
Even for well characterized materials, uncertainty about the value of the surface recombination velocity reduces the accuracy with which the diffusion length can be determined for thinner films.
4.
Where \ tau _ \ mathrm { eff } is the effective carrier lifetime, \ tau _ \ mathrm { bulk } is the bulk carrier lifetime, s is the surface recombination velocity and d is the film or wafer thickness.
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